ATTRIBUTE-DESCRIPTION
The measurement time is the time relative to the start of
the overall sample. It is computed from the measurement
number, the waveform measurement frequency, and is refined
further by the sweep channel, axis-number and trigger.
The first-order approximation of the measurement time is
the measurement number divided by the product of 5 and the
number of measurements per waveform (from the probe
entity). For probes sampled by the low-frequency board,
the divisor is 160. For probes sampled by the
high-frequency board, the divisor is 10240.
The measurement time is achieved by adding to the
first-order approximation the correction computed by
dividing the sum of the sweep channel and the axis number
by the trigger value. For probes sampled by the
low-frequency board, the maximum value of the correction
is approximately 4.166 milliseconds. For probes sampled
by the high-frequency board, the maximum value of the
correction is approximately 68 microseconds. Because all
the different axes and probes are not measured at exactly
the same time, the correction is needed to accurately
compute the phase of the axis relative to the other axes
and probes.